DocumentCode
1874020
Title
A-Diagnosis: A Complement to Z-Diagnosis
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Purdue Univ., West Lafayette
fYear
2007
fDate
26-28 Sept. 2007
Firstpage
235
Lastpage
242
Abstract
Z-diagnosis was proposed for speeding up diagnostic fault simulation by identifying in an efficient manner fault pairs that are guaranteed to be distinguished by a fault detection test set. Z-diagnosis is based on z-sets, which capture information about the outputs to which fault effects may be propagated. We introduce a dual concept of a-diagnosis that is based on a-sets, which capture fault activation conditions. More generally, a-sets include necessary assignments for the detection of target faults. We use a -sets to speed up diagnostic fault simulation in two ways, as part of a test set independent process and as part of a test set dependent process. The test set dependent process uses only logic simulation of the test set to identify fault pairs that are guaranteed to be distinguished by the test set. We present experimental results to demonstrate the speed up in diagnostic fault simulation obtained by using a -sets in addition to z-sets.
Keywords
VLSI; fault location; fault simulation; fault tolerant computing; integrated circuit testing; sequential circuits; a-diagnosis; diagnostic fault simulation; fault activation conditions; fault detection test set; logic simulation; z-diagnosis; Circuit faults; Circuit simulation; Cities and towns; Computational modeling; Electrical fault detection; Fault detection; Fault diagnosis; Fault tolerant systems; Logic testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location
Rome
ISSN
1550-5774
Print_ISBN
978-0-7695-2885-4
Type
conf
DOI
10.1109/DFT.2007.9
Filename
4358392
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