Title :
Study of field emission microscopic images originated from coherent scattering of multiwalled carbon nanotubes
Author :
Wu, P. ; Deng, S.Z. ; Chen, Jun ; She, J.C. ; Xu, N.S.
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Zhongshan Univ., Guangzhou, China
Abstract :
In this paper, the field emission images of multiwalled carbon nanotubes (MWCNTs) was studied using field emission microscopy (FEM). The formation of observed images by electron diffraction theory was also explained in this study.
Keywords :
carbon nanotubes; electron diffraction; field emission electron microscopy; C; coherent scattering; electron diffraction theory; field emission microscopic images; multiwalled carbon nanotubes; Carbon nanotubes; Cathodes; Diffraction; Electron emission; Etching; Nanostructured materials; Organic materials; Scanning electron microscopy; Scattering; Voltage;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
Print_ISBN :
0-7803-8397-4
DOI :
10.1109/IVNC.2004.1354914
