• DocumentCode
    1874095
  • Title

    Study of field emission microscopic images originated from coherent scattering of multiwalled carbon nanotubes

  • Author

    Wu, P. ; Deng, S.Z. ; Chen, Jun ; She, J.C. ; Xu, N.S.

  • Author_Institution
    State Key Lab. of Optoelectron. Mater. & Technol., Zhongshan Univ., Guangzhou, China
  • fYear
    2004
  • fDate
    11-16 July 2004
  • Firstpage
    92
  • Lastpage
    93
  • Abstract
    In this paper, the field emission images of multiwalled carbon nanotubes (MWCNTs) was studied using field emission microscopy (FEM). The formation of observed images by electron diffraction theory was also explained in this study.
  • Keywords
    carbon nanotubes; electron diffraction; field emission electron microscopy; C; coherent scattering; electron diffraction theory; field emission microscopic images; multiwalled carbon nanotubes; Carbon nanotubes; Cathodes; Diffraction; Electron emission; Etching; Nanostructured materials; Organic materials; Scanning electron microscopy; Scattering; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
  • Print_ISBN
    0-7803-8397-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2004.1354914
  • Filename
    1354914