Title : 
Lazy Error Detection for Microprocessor Functional Units
         
        
            Author : 
Yilmaz, Mahmut ; Meixner, Albert ; Ozev, Sule ; Sorin, Daniel J.
         
        
            Author_Institution : 
Duke Univ., Durham
         
        
        
        
        
        
            Abstract : 
We propose and evaluate the use of lazy error detection for a superscalar, out-of-order microprocessor s functional units. The key insight is that error detection is off the critical path, because an instruction s results are speculative for at least a cycle after being computed. The time between computing and committing the results can be used to lazily detect errors, and laziness allows us to use cheaper error detection logic. We show that lazy error detection is feasible, we develop a low-cost mechanism for detecting errors in adders that exploits laziness, and we show that an existing error detection scheme for multipliers can exploit laziness.
         
        
            Keywords : 
adders; logic testing; microprocessor chips; multiplying circuits; adder circuit; critical path; error detection logic; lazy error detection; microprocessor functional units; multiplier circuit; out-of-order microprocessor; superscalar microprocessor; Computer aided instruction; Computer errors; Computer science; Electrical fault detection; Energy consumption; Fault tolerant systems; Hardware; Microprocessors; Out of order; Very large scale integration;
         
        
        
        
            Conference_Titel : 
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
         
        
            Conference_Location : 
Rome
         
        
        
            Print_ISBN : 
978-0-7695-2885-4
         
        
        
            DOI : 
10.1109/DFT.2007.16