• DocumentCode
    1874438
  • Title

    Industrial high-rate (∼14 nm/s) deposition of low resistive and transparent ZnOx:Al films on glass

  • Author

    Illiberi, A. ; Kniknie, B. ; van Deelen, J. ; Steijvers, H.L.A.H. ; Habets, D. ; Simons, P.J.P.M. ; Janssen, A.C. ; Beckers, E.H.A.

  • Author_Institution
    Netherlands Organ. for Appl. Sci. Res. (TNO), Eindhoven, Netherlands
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    The results presented in this paper show that highly conductive and transparent ZnOx:Al films can be grown on glass by a high throughput industrial CVD process at atmospheric pressure. Amorphous silicon p-i-n solar cells have been grown on as deposited ZnOx:Al films in order to demonstrate the suitability of this material as front contact for thin silicon film solar cells. Aluminum doped ZnOx (ZnOx:Al) films have been deposited on glass in an in-line industrial-type reactor by a metalorganic chemical vapor deposition process at atmospheric pressure. Tertiary-butanol has been used as oxidant for diethylzinc and trimethylaluminium as dopant gas. ZnOx:Al films can be grown at very high deposition rates of ~ 14 nm/s for a substrate speed from 150 mm/min to 500 mm/min. The electrical, structural (crystallinity and morphology) and optical properties of the deposited films have been characterized by using Hall, four point probe, X-ray diffraction, atomic force microscope and spectrophotometer, respectively. All the films have c-axis, (002) preferential orientation and good crystalline quality. ZnOx:Al films are highly conductive (R <; 9 Ohm/sq, for a film thickness above 1300 nm) and transparent in the visible range (>; 80%). Amorphous silicon p-i-n solar cells have been grown on as deposited ZnOx:Al films, without optimizing the surface texturing of ZnOx:Al films to enhance light scattering. An initial efficiency of approximately 8% has been achieved.
  • Keywords
    MOCVD; X-ray diffraction; aluminium; amorphous semiconductors; atmospheric pressure; atomic force microscopy; semiconductor thin films; silicon; solar cells; spectrophotometers; zinc compounds; X-ray diffraction; ZnO:Al; amorphous silicon p-i-n solar cells; atmospheric pressure; atomic force microscope; crystalline quality; four point probe; front contact; industrial CVD process; light scattering; metalorganic chemical vapor deposition; preferential orientation; semiconductor thin films; spectrophotometer; surface texturing; tertiary butanol; thin silicon film solar cells; Conductivity; Films; Glass; Photovoltaic cells; Substrates; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186688
  • Filename
    6186688