Title :
A study of adhesion forces in thick epitaxial polysilicon under dynamic impact loading
Author :
Dellea, Stefano ; Ardito, Raffaele ; De Masi, Biagio ; Rizzini, Francesco ; Tocchio, Alessandro ; Langfelder, Giacomo
Author_Institution :
Politec. di Milano, Milan, Italy
Abstract :
The work presents a structure and a method for the in-line characterization of impacts and adhesion phenomena between MEMS moving and fixed parts: the focus is on the monitoring of an inertial proof mass motion when colliding with a mechanical stopper. Through such measurements, one can evaluate the energy balance during impact events. The work analyzes the adhesion force evolution after a number of impact cycles comparable or larger than shocks in a 5-year operation. Results obtained on two different specimens show growing and then stabilizing adhesion forces of on average 170 nN, under impact cycles with about 500 fJ energy loss. No marked dependence on the specimen area is obtained. The possibility to change and track the impact kinetic energy is also demonstrated.
Keywords :
adhesion; elemental semiconductors; epitaxial layers; micromechanical devices; silicon; MEMS; Si; adhesion force evolution; adhesion phenomena; dynamic impact loading; energy balance; energy loss; impact kinetic energy; in-line characterization; inertial proof mass motion; mechanical stopper; thick epitaxial polysilicon; time 5 year; Adhesives; Capacitance-voltage characteristics; Electric shock; Force; Force measurement; Micromechanical devices; Monitoring;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2015 28th IEEE International Conference on
Conference_Location :
Estoril
DOI :
10.1109/MEMSYS.2015.7051092