DocumentCode
1874558
Title
Safety Evaluation of NanoFabrics
Author
Grosso, Michelangelo ; Rebaudengo, Maurizio ; Reorda, Matteo Sonza
Author_Institution
Politecnico di Torino, Torino
fYear
2007
fDate
26-28 Sept. 2007
Firstpage
418
Lastpage
426
Abstract
Chemically assembled electronic nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing digital circuits. The paper proposes some preliminary considerations about safety of application-oriented nanoFabrics based on some results obtained through an automated platform for fault simulation. In particular, a single-fault detecting methodology is proposed and evaluated. Different fault models have been taken into account in order to evaluate alternative scenarios.
Keywords
digital circuits; fault simulation; nanoelectronics; CMOS fabrication; digital circuits; electronic nanotechnology; fault simulation; nanofabrics; safety evaluation; single-fault detecting methodology; CMOS technology; Chemicals; Circuit faults; Circuit simulation; Fabrication; Nanoscale devices; Nanotechnology; Programmable logic arrays; Redundancy; Safety;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location
Rome
ISSN
1550-5774
Print_ISBN
978-0-7695-2885-4
Type
conf
DOI
10.1109/DFT.2007.50
Filename
4358411
Link To Document