Title :
Safety Evaluation of NanoFabrics
Author :
Grosso, Michelangelo ; Rebaudengo, Maurizio ; Reorda, Matteo Sonza
Author_Institution :
Politecnico di Torino, Torino
Abstract :
Chemically assembled electronic nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing digital circuits. The paper proposes some preliminary considerations about safety of application-oriented nanoFabrics based on some results obtained through an automated platform for fault simulation. In particular, a single-fault detecting methodology is proposed and evaluated. Different fault models have been taken into account in order to evaluate alternative scenarios.
Keywords :
digital circuits; fault simulation; nanoelectronics; CMOS fabrication; digital circuits; electronic nanotechnology; fault simulation; nanofabrics; safety evaluation; single-fault detecting methodology; CMOS technology; Chemicals; Circuit faults; Circuit simulation; Fabrication; Nanoscale devices; Nanotechnology; Programmable logic arrays; Redundancy; Safety;
Conference_Titel :
Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on
Conference_Location :
Rome
Print_ISBN :
978-0-7695-2885-4
DOI :
10.1109/DFT.2007.50
