Title :
A pragmatic test and diagnosis methodology for partially testable MCMs
Author :
Lubaszewski, Marcelo ; Marzouki, Meryem ; Touati, Mohamed Hedi
Author_Institution :
TIMA, Inst. Nat. Polytech. de Grenoble, France
Abstract :
Current MCM market cannot afford yet 100% product testability. This paper presents a way to get along with partial testability. Under the assumption that module-level boundary scan is available and that, at the chip-level, it is only implemented in some of the dies, we propose a methodology for simultaneous test and diagnosis of boundary scan and non boundary scan parts
Keywords :
automatic testing; boundary scan testing; circuit analysis computing; fault location; integrated circuit testing; knowledge based systems; multichip modules; MCM testing; module-level boundary scan; nonboundary scan parts; partially testable MCMs; test/diagnosis methodology; Circuit faults; Circuit testing; Costs; Integrated circuit interconnections; Integrated circuit testing; Packaging; Probes; Qualifications; Quality assurance; Time to market;
Conference_Titel :
Multi-Chip Module Conference, 1994. MCMC-94, Proceedings., 1994 IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-5560-7
DOI :
10.1109/MCMC.1994.292518
