• DocumentCode
    1875046
  • Title

    Impact of cadmium-rich back surfaces on cadmium chloride treatment and device performance in close space sublimation deposited CdTe solar cells

  • Author

    Major, J.D. ; Proskuryakov, Y.Y. ; Durose, K.

  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    The cool-down process following close-space sublimation deposition of CdTe films has been found to induce the formation of a Cd-rich layer at the back surface. It has also been shown that this layer may subsequently block the in-diffusion of CdCl2 used in the post-growth activation step of solar cell devices. Various routes to correct this have been investigated, with the most effective being found to be pre-etching of the as-grown surfaces prior to doping with a nitric-phosphoric acid etch. This leads to increase in the amount of chlorine and oxygen in-diffusion owing to the formation of a Te-rich layer and this improves device efficiency from ~2% to ~10%. Incorporation of the etching step into device processing for CdTe/CdS devices with a ZnO buffer layer and two-stage CdTe growth allowed for fabrication of cells having 13.6% efficiency (1 cm2). The devices were grown on NSG TEC™ C15, an SnO2:F multilayer on low iron soda lime glass.
  • Keywords
    II-VI semiconductors; cadmium compounds; etching; semiconductor growth; semiconductor thin films; solar cells; sublimation; wide band gap semiconductors; zinc compounds; CdTe-CdS; NSG TEC C15; ZnO; buffer layer; cadmium chloride treatment; cadmium-rich back surfaces; close space sublimation deposited solar cells; cool-down process; device performance; efficiency 13.6 percent; low iron soda lime glass; nitric-phosphoric acid etching; oxygen in-diffusion; post-growth activation step; Cooling; Doping; Etching; Performance evaluation; Photovoltaic cells; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186711
  • Filename
    6186711