• DocumentCode
    1875146
  • Title

    Laminated memory: a new 3-dimensional packaging technology for MCMs

  • Author

    Tuckerman, D.B. ; Bauer, L.-O. ; Brathwaite, N.E. ; Demmin, J. ; Flatow, K. ; Hsu, R. ; Kim, P. ; Lin, C.-M. ; Lin, K. ; Nguyen, S. ; Thipphavong, V.

  • Author_Institution
    nChip Inc., San Hose, CA, USA
  • fYear
    1994
  • fDate
    15-17 Mar 1994
  • Firstpage
    58
  • Lastpage
    63
  • Abstract
    A new, low-cost, manufacturable process for stacking memory chips up to four-high on a multichip module (MCM) substrate is described. The process is particularly useful when utilized with a high-performance thin-film interconnection substrate (“MCM-D”), as the technique typically enables large (2-4x) reductions in substrate cost for memory-intensive designs, with only a small increment in assembly cost, thereby achieving lower total MCM cost, and greater utilization of the high wiring density and good thermal conductivity of the MCM substrate. The technology was developed and demonstrated using commercially available MCM assembly equipment (dicing, adhesive die attach, and wire bonding equipment). Fully functional memory modules incorporating 2-high stacks have been fabricated, and have passed basic thermal shock tests
  • Keywords
    VLSI; economics; integrated circuit manufacture; integrated memory circuits; multichip modules; 3D packaging technology; MCM cost; MCM-D; MCMs; adhesive die attach; assembly cost; dicing; functional memory modules; high wiring density; high-performance thin-film interconnection substrate; laminated memory; memory chip stacking; memory-intensive design; multichip module substrate; substrate cost; substrate thermal conductivity; thermal shock tests; wire bonding equipment; Assembly; Costs; Manufacturing processes; Multichip modules; Packaging; Stacking; Substrates; Thermal conductivity; Transistors; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multi-Chip Module Conference, 1994. MCMC-94, Proceedings., 1994 IEEE
  • Conference_Location
    Santa Cruz, CA
  • Print_ISBN
    0-8186-5560-7
  • Type

    conf

  • DOI
    10.1109/MCMC.1994.292526
  • Filename
    292526