DocumentCode
1875182
Title
An experimental study on discriminative concept classifier combination for TRECVID high-level feature extraction
Author
Byun, Byungki ; Ma, Chengyuan ; Lee, Chin-Hui
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
2532
Lastpage
2535
Abstract
In this paper, we present an experimental study on using high-dimensional image features to perform discriminative classifier combination for TRECVID concept detection. We combine a multi-class classifier with binary-class classifiers. After training a multi-class classifier, we train binary-class classifiers by decomposing a multi-class problem into several binary-class classification problems, and fuse them together using a discriminative classifier combination approach. This idea leverages on each classifier´s properties; multi-class classifiers emphasize on segmenting a decision space optimally in terms of some overall performance criteria whereas binary classifiers focus on detecting corresponding positive samples locally. Testing on the TRECVID2005 development set with 39 LSCOM-Lite concepts by adding an additional set of 39 pairs of binary concept classifiers, the mean average precision was improved by 34.1% over our baseline system with only 39 multi-class concept classifiers. When compared with state-of-the-art systems our proposed method is quite competitive especially for concepts with a relatively small number of positive samples.
Keywords
feature extraction; image classification; video coding; TRECVID concept detection; binary class classification; binary class classifiers; binary concept classifiers; decision space segmentation; discriminative classifier; discriminative concept classifier combination; image feature extraction; multiclass concept classifiers; Feature extraction; classifier combination; high-level feature extraction; video annotation; video indexing;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
1522-4880
Print_ISBN
978-1-4244-1765-0
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2008.4712309
Filename
4712309
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