Title :
Radio-frequency solder film surface resistance measurement
Author :
Vaclav, P. ; David, Barak ; Jiri, P.
Author_Institution :
Dept. of Electrotechnol., Czech Tech. Univ. in Prague, Prague, Czech Republic
Abstract :
This paper deals with thin solder film measurement using high frequency resonator. Measurement of surface resistance of a conductor that consists of a layer of solder that is applied to the conductive material was done on high frequency, in the range of 500-5000 MHz. This frequency range is chosen because the skin effect concentrates the current flow in a conductor in its surface layer. The RF resistance is critically determined by the properties of a few micrometer thick layer.
Keywords :
Q-factor; electric resistance measurement; electrical conductivity measurement; electrical resistivity; metallic thin films; radiofrequency measurement; resonance; skin effect; solders; surface conductivity; surface resistance; RF resistance; conductive material; conductor surface layer; current flow; frequency 500 MHz to 5000 MHz; high frequency resonator; micrometer thick coating layer; quality factor; radiofrequency surface resistance measurement; resonant frequency; skin effect; surface layer conductivity; thin solder film measurement; Conductivity; Conductors; Couplings; Electrical resistance measurement; Frequency measurement; Q factor; Resonant frequency;
Conference_Titel :
Applied Electronics (AE), 2011 International Conference on
Conference_Location :
Pilsen
Print_ISBN :
978-1-4577-0315-7
Electronic_ISBN :
1803-7232
