Title :
A new column redundancy scheme for fast access time of 64-Mb DRAM
Author :
Young-Hyun Jun ; Tae-Hoon Kim ; Jae-Sik Lee ; Seong-Jin Jang ; Hee-Gook Lee
Author_Institution :
GoldStar Electron Central Research Laboratory
Keywords :
CMOS process; CMOS technology; Circuits; Delay effects; Electrons; Fuses; Laboratories; Random access memory; Signal generators; Voltage;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
