Title :
Heavy ions test result on a 65nm Sparc-V8 radiation-hard microprocessor
Author :
Bottoni, C. ; Glorieux, M. ; Daveau, J.M. ; Gasiot, Gilles ; Abouzeid, Fady ; Clerc, Sylvain ; Naviner, L. ; Roche, Philippe
Author_Institution :
STMicroelectron., Crolles, France
Abstract :
In this paper, we present the heavy-ion radiation test results for a 7-stage SPARC micro-processor. Special software handlers enabled fine grained classification of the types of crashes. The measured crash cross sections are compared with those predicted by fault injection simulation.
Keywords :
integrated circuit testing; microprocessor chips; radiation hardening (electronics); 7-stage SPARC microprocessor; Sparc-V8 radiation-hard microprocessor; fault injection simulation; fine grained classification; heavy ions test; measured crash cross sections; size 65 nm; software handlers; Computer crashes; Field programmable gate arrays; Microprocessors; Registers; Software; System-on-chip; Timing;
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
DOI :
10.1109/IRPS.2014.6861096
