Title :
Influence of stress on the field emission properties of amorphous carbon thin films and multiwall carbon nanotube-polymer composites
Author :
Poa, C.H.P. ; Lacerda, R.G. ; Silva, S.R.P. ; Marques, F.C.
Author_Institution :
Adv. Technol. Inst., Surrey Univ., Guildford, UK
Abstract :
This work investigates the effects of stress on carbon-based materials during field emission. Amorphous carbon films containing nano-crystalline particles and MWNT composite thin films are subjected to external stress by mechanical bending. The samples were bent using an optical fibre placed in the middle of the sample. Field emission properties were measured using the probe technique.
Keywords :
amorphous semiconductors; bending; carbon nanotubes; composite materials; field emission; polymer films; semiconductor thin films; stress effects; C; amorphous carbon thin films; field emission properties; mechanical bending; multiwall carbon nanotube-polymer composites; optical fibre; stress effects; Amorphous materials; Carbon dioxide; Carbon nanotubes; Optical fibers; Optical films; Optical materials; Organic materials; Probes; Stress; Transistors;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
Print_ISBN :
0-7803-8397-4
DOI :
10.1109/IVNC.2004.1354968
