Title : 
Interleaved forward converter with ripple-free circuit for humane killer poultry applications
         
        
            Author : 
Tseng, S.-Y. ; Chiang, T.-Y. ; Wang, K.-C. ; Chuang, S.-A.
         
        
            Author_Institution : 
Dept. of Electr. Eng., Chang Gung Univ., Taoyuan, Taiwan
         
        
        
        
        
        
            Abstract : 
The paper proposes a novel application for poultry of humane killing. The proposed poultry killer consists of two forward converter and two half-bridge inverters. In each forward converter, a ripple-free circuit is introduced into the one to achieve output current with ripple-free and to generate a high pulse voltage which is used to induce breakdown of poultry skin, feather or scale in feet. With the approach, forward converter with ripple-free circuit can reduce volume and size of output filter and rapid generate the breakdown of poultry skin to speed up poultry killing. Moreover, half-bridge inverter is used to chop dc voltage into pulse voltage at low frequency for sustaining the desired killing current during poultry killing time. Finally, a prototype under maximum skin breakdown voltage of 10 kV, killing voltage of 150 V, killing current of 1 A and killing time of 6 s has been implemented to verify the feasibility of the proposed poultry killer.
         
        
            Keywords : 
DC-DC power convertors; farming; invertors; current 1 A; half-bridge inverters; humane killer poultry application; interleaved forward converter; output filter; poultry killing; poultry skin; pulse voltage; ripple-free circuit; time 6 s; voltage 10 kV; voltage 150 V; Breakdown voltage; Electric breakdown; Feathers; Filters; Frequency; Low voltage; Pulse circuits; Pulse generation; Pulse inverters; Skin; forward converter; humane killing; poultry killer; ripple-free circuit and half-bridge inverter;
         
        
        
        
            Conference_Titel : 
Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
         
        
            Conference_Location : 
Palm Springs, CA
         
        
        
            Print_ISBN : 
978-1-4244-4782-4
         
        
            Electronic_ISBN : 
1048-2334
         
        
        
            DOI : 
10.1109/APEC.2010.5433414