• DocumentCode
    1875574
  • Title

    Emission limited electrostatic atomization and the fine structure constant

  • Author

    Kelly, A.J.

  • Author_Institution
    ZYW Corp., Princeton, NJ, USA
  • fYear
    2004
  • fDate
    11-16 July 2004
  • Firstpage
    196
  • Lastpage
    197
  • Abstract
    Quadropole mass spectrometer measurements are obtained for charged Octoil sprays, at a droplet radius of 0.83 μm. Data are obtained for both emission limit and Rayleigh limit regime. The data revealed that operation in the emission limited regime is a function of inverse relative dielectric constant, coupling parameter rs, and the inverse fine structure constant f. The values rs and f and their ratio (rs/f) involve Planck´s constant, indicating that emission limited spraying is controlled by quantum mechanical processes. The relationship between the energy per surface charge with the droplet diameter of Octoil is also shown.
  • Keywords
    drops; fine structure; mass spectra; permittivity; sprays; surface charging; Planck constant; Rayleigh limit regime; charged Octoil sprays; coupling parameter; droplet radius; emission limited electrostatic atomization; energy per surface charge; fine structure constant; inverse relative dielectric constant; quadropole mass spectrometer measurements; quantum mechanical processes; Atomic measurements; Charge measurement; Current measurement; Dielectric measurements; Electrons; Electrostatic measurements; Physics; Quantum mechanics; Spraying; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
  • Print_ISBN
    0-7803-8397-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2004.1354969
  • Filename
    1354969