Title : 
Emission limited electrostatic atomization and the fine structure constant
         
        
        
            Author_Institution : 
ZYW Corp., Princeton, NJ, USA
         
        
        
        
        
        
            Abstract : 
Quadropole mass spectrometer measurements are obtained for charged Octoil sprays, at a droplet radius of 0.83 μm. Data are obtained for both emission limit and Rayleigh limit regime. The data revealed that operation in the emission limited regime is a function of inverse relative dielectric constant, coupling parameter rs, and the inverse fine structure constant f. The values rs and f and their ratio (rs/f) involve Planck´s constant, indicating that emission limited spraying is controlled by quantum mechanical processes. The relationship between the energy per surface charge with the droplet diameter of Octoil is also shown.
         
        
            Keywords : 
drops; fine structure; mass spectra; permittivity; sprays; surface charging; Planck constant; Rayleigh limit regime; charged Octoil sprays; coupling parameter; droplet radius; emission limited electrostatic atomization; energy per surface charge; fine structure constant; inverse relative dielectric constant; quadropole mass spectrometer measurements; quantum mechanical processes; Atomic measurements; Charge measurement; Current measurement; Dielectric measurements; Electrons; Electrostatic measurements; Physics; Quantum mechanics; Spraying; Surface morphology;
         
        
        
        
            Conference_Titel : 
Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
         
        
            Print_ISBN : 
0-7803-8397-4
         
        
        
            DOI : 
10.1109/IVNC.2004.1354969