• DocumentCode
    1875588
  • Title

    Ion-beam morphological conditioning of carbon field emission cathode surfaces

  • Author

    Hunt, Charles E. ; Chakhovskoi, Andrei G. ; Wang, Yu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
  • fYear
    2004
  • fDate
    11-16 July 2004
  • Firstpage
    198
  • Lastpage
    199
  • Abstract
    Square-cm samples of bulk graphite, reticulated vitreous carbon, and paste graphite film have been evaluated for field-emission properties both before and after surface modification using a novel Ar-ion flood bombardment method. The Ar-ion treatment results in a change in surface morphology of the emission cathode which physically resembles results of emission treatments using lasers or other heat sources, as well as results obtained using current or voltage stress treatment methods. Emission properties become more uniform, exhibit less noise, and, in the best cases, match results seen from carbon nanotubes or ultra-nanocrystalline diamond cathodes. The results demonstrate a method for obtaining large total currents at optimal extraction voltages, from large-area, low-cost cathodes. This method is useful for applications, such as field-emission lamps and x-ray tubes, which do not require nanofabricated cathode structures.
  • Keywords
    cathodes; field emission; graphite; ion beam effects; surface morphology; vitreous state; Ar-ion flood bombardment method; C; bulk graphite; carbon field emission cathode surfaces; ion-beam morphological conditioning; optimal extraction voltages; paste graphite film; reticulated vitreous carbon; stress treatment methods; surface modification; surface morphology; Carbon dioxide; Cathodes; Floods; Laser noise; Laser theory; Laser transitions; Surface emitting lasers; Surface morphology; Surface treatment; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
  • Print_ISBN
    0-7803-8397-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2004.1354970
  • Filename
    1354970