DocumentCode
1875591
Title
Multi-Functioning AFM Cantilever for Mechanical Tests: Indentation, Strip Bending and Adhesion Tests
Author
Lee, Hak-Joo ; Cho, Kiho ; Kim, Jae-Hyun ; Kim, Jong-Man ; Kim, Yong-Kweon ; Baek, Chang-Wook
Author_Institution
Korea Institute of Machinery and Materials, Daejeon, Republic of Korea
fYear
2006
fDate
2006
Firstpage
218
Lastpage
221
Abstract
This paper reports on the development of a novel AFM cantilever and its application to various mechanical tests for characterizing micro/nano-structures. We have designed and fabricated rhombus-shaped AFM cantilevers capable of performing multi-functioning tasks by using single crystal silicon (SCS) micromachining techniques. Structural improvement of the cantilever has clearly solved the crucial problems resulted from using conventional simple beam-AFM cantilever for mechanical testings. After force-calibration of the cantilever, various mechanical tests such as indentation, strip bending and adhesion tests are performed to determine the mechanical behaviors in micro/nano-scale as well as topographic imaging.
Keywords
Adhesives; Atomic force microscopy; Materials testing; Mechanical sensors; Micromechanical devices; Sensor phenomena and characterization; Spatial resolution; Strips; Structural beams; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2006. MEMS 2006 Istanbul. 19th IEEE International Conference on
Conference_Location
Istanbul, Turkey
ISSN
1084-6999
Print_ISBN
0-7803-9475-5
Type
conf
DOI
10.1109/MEMSYS.2006.1627775
Filename
1627775
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