• DocumentCode
    1875591
  • Title

    Multi-Functioning AFM Cantilever for Mechanical Tests: Indentation, Strip Bending and Adhesion Tests

  • Author

    Lee, Hak-Joo ; Cho, Kiho ; Kim, Jae-Hyun ; Kim, Jong-Man ; Kim, Yong-Kweon ; Baek, Chang-Wook

  • Author_Institution
    Korea Institute of Machinery and Materials, Daejeon, Republic of Korea
  • fYear
    2006
  • fDate
    2006
  • Firstpage
    218
  • Lastpage
    221
  • Abstract
    This paper reports on the development of a novel AFM cantilever and its application to various mechanical tests for characterizing micro/nano-structures. We have designed and fabricated rhombus-shaped AFM cantilevers capable of performing multi-functioning tasks by using single crystal silicon (SCS) micromachining techniques. Structural improvement of the cantilever has clearly solved the crucial problems resulted from using conventional simple beam-AFM cantilever for mechanical testings. After force-calibration of the cantilever, various mechanical tests such as indentation, strip bending and adhesion tests are performed to determine the mechanical behaviors in micro/nano-scale as well as topographic imaging.
  • Keywords
    Adhesives; Atomic force microscopy; Materials testing; Mechanical sensors; Micromechanical devices; Sensor phenomena and characterization; Spatial resolution; Strips; Structural beams; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2006. MEMS 2006 Istanbul. 19th IEEE International Conference on
  • Conference_Location
    Istanbul, Turkey
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-9475-5
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2006.1627775
  • Filename
    1627775