• DocumentCode
    1875775
  • Title

    An active clamp ZVT converter with input-parallel and output-series configuration

  • Author

    Zhao, Yi ; Li, Wuhua ; Li, Weichen ; He, Xiangning

  • Author_Institution
    Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    1454
  • Lastpage
    1459
  • Abstract
    A novel converter is proposed in this paper to satisfy the high power, high step-up and isolated conversion requirements. In the proposed converter, the input-parallel configuration is adopted to share the large input current and reduce the conduction losses, while the output-series configuration is adopted to get a high voltage gain. Consequently, a transformer with a low turns ratio can be applied, which makes the transformer optimized easier. Moreover, the active clamp circuits are employed here to reduce the voltage stress of the switches and recycle the energy stored in the leakage inductance, and ZVT is achieved during the whole switching transition for all the active switches, so the switching losses can be reduced greatly. Furthermore, the diode reverse-recovery problem is partly solved due to the leakage inductance. Finally, a 40 V-input 400 V-output 1 kW prototype is built to demonstrate the theoretical analysis, and the maximum efficiency of 94.9% and 93.3% at full load are achieved.
  • Keywords
    DC-DC power convertors; power transformers; switching convertors; DC-DC converters; active clamp ZVT converter; conduction losses; diode reverse-recovery problem; efficiency 93.3 percent; efficiency 94.9 percent; high voltage gain; input-parallel configuration; leakage inductance; low turns ratio; output-series configuration; power 1 kW; switches; switching losses; transformer; voltage 40 V; voltage 400 V; voltage stress; Clamps; Diodes; Inductance; Inductors; Recycling; Stress; Switches; Switching circuits; Switching loss; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
  • Conference_Location
    Palm Springs, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-4782-4
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2010.5433421
  • Filename
    5433421