DocumentCode
1875802
Title
In situ elastic property characterization of flip-chip underfills
Author
Canumalla, Sridhar ; Oravecz, Michael G.
Author_Institution
Sonoscan Inc., Bensenville, IL, USA
fYear
1998
fDate
15-18 Mar 1998
Firstpage
106
Lastpage
110
Abstract
The elastic properties of processing related inhomogeneities, such as filler settling and voids, are characterized using the acoustic microscope. A procedure to calculate the acoustic impedance of materials, and hence the elastic properties, at internal interfaces is proposed. The acoustic impedance of the silica filled polymer material under the die is measured at different locations corresponding to areas of different brightness in the acoustic image. Correlating the acoustic impedance measurements with the HS-model indicated that a) darker areas are regions where the underfill has a homogeneous distribution of filler; b) lighter areas are regions characterized by filler settling. Destructive cross sectioning and microscopy confirmed the above predictions. Further, the elastic properties of the different areas adjacent to the die are estimated using the model. The relatively quick, nondestructive technique presented in this paper could be useful in advanced process control, rapid yield management and in providing input into package reliability studies (such as finite element analysis)
Keywords
acoustic impedance; acoustic microscopy; elastic moduli measurement; flip-chip devices; inspection; plastic packaging; ultrasonic materials testing; voids (solid); Hashin-Shtrikman lower bound; acoustic impedance; acoustic microscope; advanced process control; destructive cross sectioning; engineering moduli; filler settling; flip-chip underfills; homogeneous distribution of filler; in situ elastic property characterization; internal interfaces; nondestructive technique; package reliability studies; processing related inhomogeneities; rapid yield management; silica filled polymer; voids; Acoustic materials; Acoustic measurements; Area measurement; Brightness; Impedance measurement; Microscopy; Packaging; Polymers; Process control; Silicon compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials, 1998. Proceedings. 1998 4th International Symposium on
Conference_Location
Braselton, GA
Print_ISBN
0-7803-4795-1
Type
conf
DOI
10.1109/ISAPM.1998.664443
Filename
664443
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