Title :
Novel flat MIS electron emitter
Author :
Govyadinov, Alex ; Novet, Thomas ; Benning, Paul ; Pidwerbecki, David ; Ramamoorthi, Sriram ; Smith, Jim ; Otis, Chuck ; Neiman, David ; Chen, John
Author_Institution :
Hewlett-Packard Co., Corvallis, OR, USA
Abstract :
The flat metal-insulator-semiconductor (MIS) electron emitter is a simple design allowing easy manufacture, and is relatively insensitive to environment conditions making operation possible in poor vacuum conditions. A stack of 5000 Å polysilicon/150 Å silicon oxide/50 Å gold deposited on n++ doped silicon showed the best performance. We have observed emission current densities as high as 2-10 A/cm2 at efficiencies from 3-10%. The polysilicon serves a dual role. Bumps on the poly surface act as field-enhanced emission sites while the bulk of the film behaves as a ballast resistor that prevents run away emission from any one emission site. The thin gold layer self-assembles into a nano-mesh with >100 pores/μm2 through which electrons escape. Emission theory, including energy distribution and angular divergence of the emitted beams, are discussed.
Keywords :
MIS devices; current density; electron field emission; elemental semiconductors; gold; insulating thin films; metallic thin films; self-assembly; semiconductor thin films; silicon; silicon compounds; 150 angstrom; 3 to 10 percent; 50 angstrom; 5000 angstrom; Si-SiO2-Au; angular divergence; ballast resistor; efficiency; emission current density; emission site; emission theory; emitted beams; energy distribution; field-enhanced emission sites; film; flat MIS electron emitter; flat metal-insulator-semiconductor electron emitter; gold layer; n++ doped silicon; nanomesh; poly surface; polysilicon; run away emission; self-assembly; silicon oxide; Dielectrics and electrical insulation; Electron emission; Electron guns; Electron sources; Electronic ballasts; Gold; Manufacturing; Metal-insulator structures; Resistors; Silicon;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
Print_ISBN :
0-7803-8397-4
DOI :
10.1109/IVNC.2004.1354980