DocumentCode :
187589
Title :
Electrical breakdown in polymers for BEOL applications: Dielectric heating and humidity effects
Author :
Palit, Sarbani ; Alam, Md. Ashraful
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2014
fDate :
1-5 June 2014
Abstract :
Polymer dielectrics may be used as low-k BEOL dielectrics, however, premature electrical breakdown due to high electric fields, high frequencies and ambient humidity conditions have restricted its widespread adoption. In this study, we show that dielectric heating is the primary AC degradation mechanism in polymer dielectrics, and develop an analytical model that is consistent with measured trends in stress tests under both AC and DC electric fields. We also study the effect of exposure to ambient relative humidity on the lifetime of polymer dielectrics.
Keywords :
electric breakdown; electric fields; humidity; low-k dielectric thin films; polymers; AC electric fields; DC electric fields; ambient humidity conditions; analytical model; dielectric heating; electrical breakdown; humidity effects; low-k BEOL dielectrics; low-k back-end of line dielectrics; polymer dielectrics; primary AC degradation mechanism; stress tests; Dielectric measurement; Dielectrics; Electric breakdown; Electric fields; Humidity; Plastics; Stress; Dielectric breakdown; Dielectric films; Humidity control; Polymer films; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
Type :
conf
DOI :
10.1109/IRPS.2014.6861114
Filename :
6861114
Link To Document :
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