• DocumentCode
    1876000
  • Title

    An EM algorithm for robust Bayesian PCA with student’s t-distribution

  • Author

    Gai, Jiading ; Li, Yong ; Stevenson, Robert L.

  • Author_Institution
    Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick Hall, IN 46556, USA
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    2672
  • Lastpage
    2675
  • Abstract
    Principal component analysis (PCA) is a technique that is widely used for applications such as dimensionality reduction, image compression, feature extraction and data visualization. One of the key issues in the use of PCA for modelling is that it is very sensitive to outliers since its formulation is based on Gaussian density model. Lately, more heavy-tailed distribution (i.e., Student’s t-distribution) is introduced to increase the robustness of traditional PCA. But the robust version of PCA is expressed as the maximum likelihood solution of a probabilistic latent variable model. This reformulation raises the question of how to determine the optimal number of principal components to be retained. In this paper, we develop a Bayesian model selection approach to estimate the true dimensionality of the data. The proposed algorithm is based on a new Bayesian treatment of robust Student’s t-distribution PCA. A simple Expectation-Maximization (EM) solver is introduced to find approximate solutions for the model. Experiments show that the proposed model achieves simultaneous optimal dimensionality selection and accurate principal components recovery.
  • Keywords
    Algorithm design and analysis; Bayesian methods; Context modeling; Feature extraction; Gaussian distribution; Image coding; Maximum likelihood estimation; Noise robustness; Principal component analysis; Tail; EM algorithm; Robust Bayesian principal component analysis; Student’s t-distribution; evidence approximation; image modelling; subspace representation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4712344
  • Filename
    4712344