DocumentCode
1876040
Title
Comparison of noise and emission characteristics between individually operated NbC/Nb and Ir field emitter array cathodes and etched W[100] emitters
Author
Charbonnier, Francis ; Southall, Larry A. ; Mackie, William A.
Author_Institution
Appl. Phys. Technol., Inc., McMinnville, OR, USA
fYear
2004
fDate
11-16 July 2004
Firstpage
230
Lastpage
231
Abstract
Oriented single crystal tungsten field emitters mounted on a filament were fabricated using electrolytic etch. The emission pattern of the W emitters was observed and recorded using digital movie camera, allowing the correlation of phosphor patterns with continuous current data. The W tips were operated at room temperature and at temperatures up to 1000 K. Current fluctuations relative to the mean within consecutive short time segments were recorded and their distribution was plotted. The mean ΔI/I was determined as a function of residual pressure. I(V) characteristics were measured. Emission stability was analyzed using s-i charts. The results were compared to the short-term current fluctuations previously observed from single NbC/Nb field emitters.
Keywords
current fluctuations; etching; field emission; field emitter arrays; niobium; niobium compounds; phosphors; tungsten; 20 degC; I(V) characteristics; Nb; NbC; NbC/Nb field emitter; W; W tips; current fluctuations; electrolytic etch; emission pattern; emission stability; etched W[100] emitters; noise; oriented single crystal tungsten field emitters; phosphor patterns; residual pressure; s-i charts; Cathodes; Digital cameras; Etching; Field emitter arrays; Fluctuations; Motion pictures; Niobium compounds; Phosphors; Temperature distribution; Tungsten;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
Print_ISBN
0-7803-8397-4
Type
conf
DOI
10.1109/IVNC.2004.1354988
Filename
1354988
Link To Document