DocumentCode :
187608
Title :
A physical and scalable aging model for digital library characterization
Author :
Kufluoglu, H. ; Cirba, C. ; Chu, Michael ; Chen, Mei ; Datla, S. ; Reddy, Veerababu
Author_Institution :
Analog Technol. Dev., Texas Instrum., Dallas, TX, USA
fYear :
2014
fDate :
1-5 June 2014
Abstract :
A method of incorporating NBTI, PBTI or CHC aging in digital library characterization is presented. This new model gives physical trends under dynamic VDD and temperature profiles. The aging model is directly compatible with existing library characterization flow and the computation time is practically unchanged.
Keywords :
ageing; integrated circuit modelling; integrated circuit reliability; negative bias temperature instability; CHC aging; NBTI aging; PBTI aging; channel hot carrier reliability; digital library characterization; negative bias temperature instability; physical aging model; positive bias temperature instability; scalable aging model; Aging; Computational modeling; Degradation; Integrated circuit modeling; Libraries; SPICE; Temperature measurement; HCI; NBTI; PBTI; circuit aging; compact model; degradation; digital library characterization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
Type :
conf
DOI :
10.1109/IRPS.2014.6861124
Filename :
6861124
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=187608
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