DocumentCode :
1876480
Title :
Increase in emission current after high-frequency low-voltage pulse application observed for nano-pillar cathode
Author :
Yoshida, Tomoya ; Baba, Akiyoshi ; Asano, Tanemasa
Author_Institution :
Center for Microelectron. Syst., Kyushu Inst. of Technol., Fukuoka, Japan
fYear :
2004
fDate :
11-16 July 2004
Firstpage :
258
Lastpage :
259
Abstract :
We demonstrated the drastically increase in emission current by applying high-frequency low-voltage pulses in gated organic nano-pillar cold cathodes. This method is effective to increase the number of emission site without destruction of emitter tip, because the transient current is considered to induce the heat at even at inactive emitter tip. This result suggests that high-frequency low-voltage pulse application increases the number of emission site due to rise in temperature caused by transient current flowing during the application of the pulses. This method is expected to be an effective post-fabrication treatment method of field emitters after vacuum sealing.
Keywords :
cathodes; field emission; field emitter arrays; nanostructured materials; emission current; emission site; emitter tip; gated organic nanopillar cold cathodes; high-frequency low-voltage pulse application; post-fabrication treatment method; transient current; vacuum sealing; Aging; Apertures; Cathodes; Contamination; Current measurement; Electron emission; Frequency; Pulse measurements; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International
Print_ISBN :
0-7803-8397-4
Type :
conf
DOI :
10.1109/IVNC.2004.1355003
Filename :
1355003
Link To Document :
بازگشت