Title :
Characterizing the Effect of Microarchitecture Design Parameters on Workload Dynamic Behavior
Author :
Cho, Chang-Burm ; Zhang, Wangyuan ; Li, Tao
Author_Institution :
Univ. of Florida, Gainesville
Abstract :
Program runtime behavior exhibits significant variations across multiple scales. The increasing design complexity and technology scaling make microprocessor performance and efficiency increasingly depend on runtime workload dynamics. Therefore understanding the effect of design parameters on workload dynamics at early, microarchitecture exploration stage is crucial for high-performance and complexity-efficient designs. In this study, we apply wavelet-based analysis to decompose workload dynamics into a series of wavelet coefficients, which represent program behavior ranging from low-resolution approximation to high-resolution detail. We then construct error-bounded linear regression models that relate microarchitecture design parameters to various wavelet coefficients that capture workload dynamics at multiresolution levels. The most significant factors affecting program dynamics at different scales are obtained. To our knowledge, this paper presents the first work on microarchitecture design space exploration focusing on workload dynamics.
Keywords :
data flow analysis; microcomputers; regression analysis; error-bounded linear regression models; microarchitecture design parameters; program dynamics; program runtime behavior; runtime workload dynamics; wavelet coefficients; wavelet-based analysis; workload dynamic behavior; Linear regression; Microarchitecture; Microprocessors; Out of order; Process design; Runtime; Space exploration; Wavelet analysis; Wavelet coefficients; Wavelet transforms;
Conference_Titel :
Workload Characterization, 2007. IISWC 2007. IEEE 10th International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-1561-8
Electronic_ISBN :
978-1-4244-1562-5
DOI :
10.1109/IISWC.2007.4362176