Title :
Set level at speed HTOL test for reliability qualification of high speed mobile applications
Author :
Jongwoo Park ; Wooyeon Kim ; Taeyong Lee ; Donghee Lee ; Jeongsik Lim ; Jiheon Jeong ; Yunhwan Kim ; Kyongtaek Lee ; Joungsu Ryu ; Sang-Chul Shin ; Hyunjo Shin ; Sangwoo Pae
Author_Institution :
Technol. Quality Reliability, Product Quality & Reliability Team, Samsung Electron. Co. Ltd., Yongin, South Korea
Abstract :
Similar to At Speed HTOL (ASH) [1], the study of Vmin-shift induced failure on Application Processor (AP) is stretched to the “set level” stress test. The set level test enables to filter out unscreened functional or power related early fails particularly with high frequency and heavy duty scenario-based software test and as a result, field failure rate is significantly reduced. We´ll discuss the system level stress tests and its perspective as the current and future qualification required for new product introduction of high speed mobile applications.
Keywords :
integrated circuit reliability; microprocessor chips; mobile radio; ASH; application processor; field failure rate; heavy duty scenario-based software test; high-speed mobile application; minimum volatage-shift-induced failure; product introduction; reliability qualification; set level at speed HTOL test; set level stress test; system level stress test; Aging; Ash; Mobile communication; Qualifications; Reliability; Stress; Temperature sensors; AP processor; High-k; Set level test; Vmin; at speed HTOL; field failure ratel; reliability qualification;
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
DOI :
10.1109/IRPS.2014.6861170
