DocumentCode :
1877315
Title :
CW gray-track formation in KTP
Author :
Alexandrovski, A. ; Fejer, M. ; Mitchell, G.
Author_Institution :
Ginzton Lab., Stanford Univ., CA, USA
fYear :
1999
fDate :
28-28 May 1999
Firstpage :
531
Lastpage :
532
Abstract :
Summary form only given. Gray track damage in KTP crystals exposed to high power visible radiation is well known. Recently, two parallel absorbing tracks on opposite sides of the pump beam (double-tracks) were found in KTP crystals subject to high average-power high-repetition-rate green laser radiation. We report on the same effect observed with CW-laser radiation. Photothermal common-path interferometry (PCI), a modification of the photothermal technique with interferometric sensitivity, was used to detect double-track formation in the early stage of its development. Two pump beams were used, IR (1064 nm) and green (532 nm or 514 nm). A crossed-beam configuration with both pump beams collinear and probe beam crossing them inside the sample made it possible to resolve bulk and surface absorption in KTP.
Keywords :
laser beam effects; light interferometry; optical materials; photoconductivity; photothermal effects; photovoltaic effects; potassium compounds; titanium compounds; 1064 nm; 514 nm; 532 nm; CW gray-track formation; CW-laser radiation; IR pump beams; KTP; KTiOPO4; bulk absorption; crossed-beam configuration; double-track formation; double-tracks; gray track damage; green pump beams; high average-power high-repetition-rate green laser radiation; high power visible radiation; interferometric sensitivity; parallel absorbing tracks; photothermal common-path interferometry; photothermal technique; probe beam; pump beam; pump beams; surface absorption; Cameras; Computational Intelligence Society; Crystals; Electromagnetic wave absorption; Etching; Laser beams; Laser excitation; Lithium niobate; Semiconductor films; Semiconductor waveguides;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-595-1
Type :
conf
DOI :
10.1109/CLEO.1999.834553
Filename :
834553
Link To Document :
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