DocumentCode :
1877496
Title :
Naive Bayes Software Defect Prediction Model
Author :
Wang Tao ; Li Wei-hua
Author_Institution :
Sch. of Comput. Sci. & Technol., Northwestern Polytech. Univ., Xi´an, China
fYear :
2010
fDate :
10-12 Dec. 2010
Firstpage :
1
Lastpage :
4
Abstract :
Although the value of using static code attributes to learn defect predictor has been widely debated, there is no doubt that software defect predictions can effectively improve software quality and testing efficiency. Many data mining methods have already been introduced into defect predictions. We noted there have several versions of defect predictor based on Naive Bayes theory, and analyzed their difference estimation method and algorithm complexity. We found the best one which is Multi- variants Gauss Naive Bayes (MvGNB) by performing prediction performance evaluation, and we compared this model with decision tree learner J48. Experiment results on the benchmarking data sets of MDP made us believe that MvGNB would be useful for defect predictions.
Keywords :
Bayes methods; Gaussian processes; data mining; decision trees; program testing; software quality; software reliability; MvGNB; data mining methods; decision tree; multivariant Gauss Naive Bayes method; software defect prediction; software quality; software testing; static code attributes; Computational modeling; Data mining; Data models; Measurement; Object oriented modeling; Predictive models; Software;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence and Software Engineering (CiSE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-5391-7
Electronic_ISBN :
978-1-4244-5392-4
Type :
conf
DOI :
10.1109/CISE.2010.5677057
Filename :
5677057
Link To Document :
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