DocumentCode
1877755
Title
Reflection-based Surface Segmentation using Active Illumination
Author
Lindner, C. ; León, F. Puente
Author_Institution
Dept. of Meas. Syst. & Sensor Technol., Technische Univ. Munchen
fYear
2006
fDate
24-27 April 2006
Firstpage
157
Lastpage
162
Abstract
Segmentation plays an important role in image processing. Its goal is to divide an image into disjoint parts by defined rules. We present a method to accomplish an illumination-based segmentation of structured surfaces based on surface properties. To this end, an illumination series - i.e. a series of images taken with directional light from different directions - is recorded. For each location of the surface, a signal is extracted which describes the intensity of the corresponding point depending on the illumination angle. From this signal, features are extracted that enable a pointwise segmentation of the surface. Aided by suitable parametric models, the surface reflectance is described, and the corresponding parameters are estimated from the intensity signal. Moreover, the effect of sampling the illumination space is discussed. On the one hand, it is desirable to keep the number of illumination angles as small as possible. On the other hand, a minimum number of images is needed to achieve a reliable segmentation. The performance of the proposed approach is demonstrated with real images. They prove that the higher data acquisition expense is compensated by a significant increase of both the spatial resolution and the robustness
Keywords
feature extraction; image segmentation; surface structure; active illumination; feature extraction; illumination series; illumination-based segmentation; image processing; reflection-based surface segmentation; surface properties; surface reflectance; Data acquisition; Feature extraction; Image processing; Image sampling; Image segmentation; Lighting; Parameter estimation; Parametric statistics; Reflectivity; Spatial resolution; Segmentation; illumination space sampling; reflection properties; surface quality measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location
Sorrento
ISSN
1091-5281
Print_ISBN
0-7803-9359-7
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2006.328360
Filename
4124298
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