• DocumentCode
    1878238
  • Title

    A Reconfigurable Processing Unit for Digital Circuit Testing using Built-In Self-Test Techniques

  • Author

    Elbadri, Mohammed ; Groza, Voicu ; Abielmona, Rami ; Assaf, Mansour

  • Author_Institution
    Sch. of Inf. Technol. & Eng., Ottawa Univ., Ont.
  • fYear
    2006
  • fDate
    24-27 April 2006
  • Firstpage
    239
  • Lastpage
    244
  • Abstract
    This paper introduces a novel architecture that is targeted for digital circuit testing application by means of built-in self-test techniques. These applications consist of static configurable hardware designs that will execute the testing of the digital circuit in hardware, where previous literature has established it´s testing in software consequently introducing a hardware accelerator. In this paper we show the novel architecture to digital circuit testing in hardware on a reconfigurable processing unit for compile-time reconfiguration
  • Keywords
    built-in self test; integrated circuit testing; reconfigurable architectures; built-in self-test; compile-time reconfiguration; digital circuit testing; hardware accelerator; reconfigurable processing unit; static configurable hardware designs; Application software; Automatic testing; Built-in self-test; Circuit testing; Computer architecture; Coprocessors; Digital circuits; Field programmable gate arrays; Hardware; Microprocessors; Built-In Self-Test (BIST); Circuit Under Test (CUT); Compile-Time Reconfiguration (CTR); Reconfigurable Processing Unit (RPU); fault injection testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
  • Conference_Location
    Sorrento
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-9359-7
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2006.328406
  • Filename
    4124317