• DocumentCode
    1878270
  • Title

    Evaluation of a SiC power module using low-on-resistance IEMOSFET and JBS for high power density power converters

  • Author

    Takao, Kazuto ; Shinohe, Takashi ; Harada, Shinsuke ; Fukuda, Kenji ; Ohashi, Hiromishi

  • Author_Institution
    Corporative R&D Center, Toshiba Corp., Kawasaki, Japan
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    2030
  • Lastpage
    2035
  • Abstract
    In high-power density power converter designs, power losses of power devices are essential design parameters. Silicon-carbide (SiC) power devices are expected as next generation power devices due to their superior performances compared to conventional silicon (Si) power devices. The power loss performances of a SiC power module using SiC Implantation and Epitaxial MOSFET (SiC-IEMOSFET) and Junction barrier controlled Schottky Diode (SiC-JBS) has been evaluated based on parameters of the junction temperature, current density, and switching frequency. The advantage of the SiC power module compared to a latest Si-IGBT and SiC-diode hybrid-pair module are discussed from the view point of the power loss reduction.
  • Keywords
    MOSFET; Schottky barriers; Schottky diodes; power convertors; silicon compounds; wide band gap semiconductors; Si-IGBT; SiC; SiC power module evaluation; current density; diode hybrid-pair module; epitaxial MOSFET; high-power density power converter designs; junction barrier controlled Schottky diode; junction temperature; low-on-resistance IEMOSFET; power losses; switching frequency; Current density; MOSFET circuits; Multichip modules; Performance evaluation; Power MOSFET; Schottky diodes; Silicon carbide; Switching frequency; Temperature dependence; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
  • Conference_Location
    Palm Springs, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-4782-4
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2010.5433514
  • Filename
    5433514