Title :
Accurate broadband characterization of transmission lines
Author :
Shih, Y.C. ; Kong, K.S.
Author_Institution :
MMCOMM Inc., Torrance, CA, USA
Abstract :
This paper reports a sensitivity analysis of the transmission-line parameters versus the measured S-parameters of a single line element. The results lead to a simple procedure to (1) extract the small parasitic capacitance or inductance of discontinuities, (2) obtain accurate, broadband characteristic impedance of the transmission line, and (3) estimate error bounds of the measured line parameters.
Keywords :
S-parameters; sensitivity analysis; transmission lines; S-parameters; broadband characteristic impedance; discontinuity inductance; measurement error; parameter extraction; parasitic capacitance; sensitivity analysis; transmission line; Frequency estimation; Frequency measurement; Impedance measurement; Measurement uncertainty; Propagation constant; Scattering parameters; Sensitivity analysis; Transmission line discontinuities; Transmission line measurements; Transmission lines;
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4471-5
DOI :
10.1109/MWSYM.1998.705144
