• DocumentCode
    1878702
  • Title

    New Measurement Probe for High Impedance Spectroscopy

  • Author

    Hoja, Jerzy ; Lentka, Grzegorz

  • Author_Institution
    Dept. of Metrol. & Electron. Syst., Gdansk Univ. of Technol.
  • fYear
    2006
  • fDate
    24-27 April 2006
  • Firstpage
    323
  • Lastpage
    328
  • Abstract
    The paper presents a new measurement probe working as the input circuit for a high impedance spectroscopy analyzer. The probe allows to measure impedance in the range of 100Omega<|Zx|<100GOmega. The probe extracts two signals proportional to current through and voltage across the measured impedance in a wide frequency range from 100muHz to 1MHz. By the use of a current-to-voltage converter the influence of capacitance of the shielded cables connecting the object under measurement on the result of the measurement is kept as low as possible. An analysis of the probe has been performed taking into account most important parameters influencing the measurement accuracy: parasitic capacitance and real-life parameters of operational amplifiers in use. The formula for calculation of the modulus and argument of the measured impedance has been developed taking into account the correction for real-life parameters of the probe. This allows to decrease the maximal measurement errors of the impedance modulus to ca. 2% and of the impedance argument to 2deg, respectively, in the whole range of measurement frequencies
  • Keywords
    electric impedance measurement; probes; spectroscopy; current-to-voltage converter; high impedance measurement; high impedance spectroscopy; impedance modulus; maximal measurement errors; measurement probe; operational amplifiers; parasitic capacitance; shielded cables; spectroscopy analyzer; Cable shielding; Capacitance measurement; Circuits; Current measurement; Electrochemical impedance spectroscopy; Frequency measurement; Impedance measurement; Parasitic capacitance; Probes; Voltage measurement; high impedance measurement; impedance spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
  • Conference_Location
    Sorrento
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-9359-7
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2006.328437
  • Filename
    4124336