Title :
Characterization of IGBT modules for system EMI simulation
Author :
Qi, Tao ; Graham, Jeff ; Sun, Jian
Author_Institution :
Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
EMI filtering is a critical driver for volume and weight for many applications, particularly in airborne and other mobile platforms. Because of the lack of ability to accurately predict system EMI behavior, EMI filter design usually cannot start until prototype EMI measurement results become available. This often leads to costly schedule delay and disruption, and the resulting design is suboptimal at the best. To solve this problem, systematic EMI modeling method is needed to enable the development of optimal system EMI solutions concurrent with the design of the rest of the system. This paper proposes a piece-wise linear model for IGBT (Insulated Gate Bipolar Transistor) modules for EMI simulation with sufficient accuracy and simplicity. Instead of physics-based models the proposed model is composed of a simple piece-wise linear circuit with parameters that can be extracted from the datasheet or simple device measurement. While the model is simple and easy to use, it can achieve sufficient accuracy required for EMI modeling. The proposed model is applied to a three-phase PFC and validated by comparison of model prediction with experimental measurements.
Keywords :
electromagnetic interference; filtering theory; insulated gate bipolar transistors; piecewise linear techniques; semiconductor device models; EMI filtering; EMI measurement; EMI simulation; IGBT modules; electromagnetic interference; insulated gate bipolar transistor modules; piecewise linear model; system EMI simulation; systematic EMI modeling method; three-phase PFC; Circuit simulation; Delay; Electromagnetic interference; Filtering; Filters; Insulated gate bipolar transistors; Piecewise linear techniques; Power system modeling; Predictive models; Pulse width modulation;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
Conference_Location :
Palm Springs, CA
Print_ISBN :
978-1-4244-4782-4
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2010.5433545