DocumentCode :
1879222
Title :
Learning distance metric for semi-supervised image segmentation
Author :
Jia, Yangqing ; Zhang, Changshui
Author_Institution :
Dept. of Autom., Tsinghua Univ., Beijing
fYear :
2008
fDate :
12-15 Oct. 2008
Firstpage :
3204
Lastpage :
3207
Abstract :
Semi-supervised image segmentation is an important issue in many image processing applications, and has been a popular research area recently, the most popular are graph-based methods. However, parameter selection in these methods is still largely heuristic. In this paper, we introduce distance metric learning into graph-based semi-supervised segmentation to automatically obtain good results for images with different appearances. We first derive the optimization problem with respect to the distance metric as well as the segmentation labels, and use gradient descent method to find a local optimum solution. Experiments on general images and the fungal disease analysis application have shown that our method provides a steady performance under casual user annotations and different image appearances.
Keywords :
image segmentation; learning (artificial intelligence); fungal disease analysis; gradient descent method; graph-based methods; image processing; learning distance metric; semi-supervised image segmentation; Automation; Crops; Diseases; Image analysis; Image processing; Image segmentation; Laboratories; Laplace equations; Pixel; Semisupervised learning; Semi-supervised; distance metric learning; image segmentation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location :
San Diego, CA
ISSN :
1522-4880
Print_ISBN :
978-1-4244-1765-0
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2008.4712477
Filename :
4712477
Link To Document :
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