• DocumentCode
    1879292
  • Title

    A feature analysis approach to estimate 3D Shape from Image Focus

  • Author

    Mahmood, Muhammad Tariq ; Choi, Tae-Sun

  • Author_Institution
    Sch. of Inf. & Mechatron., Gwangju Inst. of Sci. & Technol., Gwangju
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    3216
  • Lastpage
    3219
  • Abstract
    This paper introduces a new robust algorithm for shape from focus (SFF). Principal component analysis (PCA) is applied to transform the data into eigenspace and the first feature is employed to calculate the depth value. Contrary to computing the focus value locally by a focus measure in first step and then, in second step, approximating the depth map, the proposed method finds the location of the best focused value over a sequence of pixels. The proposed method is experimented using synthetic and real image sequences. The evaluation is gauged on the basis of unimodality and monotonicity of the focus curve. Two other global statistical metrics root mean square error (RMSE) and correlation have also been applied for synthetic image sequence. Experimental results have demonstrated the effectiveness and the robustness of the new method.
  • Keywords
    correlation methods; eigenvalues and eigenfunctions; feature extraction; image sequences; mean square error methods; principal component analysis; 3D shape from image focus estimation; PCA; RMSE; correlation method; eigenspace; feature analysis approach; global statistical metrics root mean square error method; principal component analysis; synthetic image sequence; Cameras; Focusing; Image analysis; Image sequences; Optical microscopy; Optical sensors; Pixel; Principal component analysis; Robustness; Shape measurement; 3D Shape Recovery; Focus Measure; PCA; Shape From Focus;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4712480
  • Filename
    4712480