• DocumentCode
    1879415
  • Title

    A spectroscopic analysis of photochemical processes in fullerenes

  • Author

    Akselrod, L. ; Byrne, Hugh J. ; Thomsen, C. ; Roth, Stefan

  • Author_Institution
    Max-Planck-Institut fur Festkorperforschung
  • fYear
    1994
  • fDate
    24-29 July 1994
  • Firstpage
    12
  • Lastpage
    12
  • Abstract
    Summary form only given. Raman spectroscopy is employed as a probe of photochemical processes in both oxygen-free and oxygenated samples of C/sub 60/. The amplitude of the peaks are observed to be sensitive to light exposuro. Each of the initially observed peaks degrades while new peaks emerge approximately ten wavenumbers to the low energy side. In oxygenated films, the degradation process is observed to be apparently slower. The process is analysed in terms of the population of the triplet state leading to sample degradation competing with the ground state recovery in an attempt to elucidate the mechanism of fte photochemical process, proposed to be a 2+2 cycloaddition in which oxygen acts to inhibit the photochemical degradation via a triplet quenching. Particular attention is paid to the dependence of the process on input light intensity. The degradation is further reported to be highly dependent on the substrate employed. At high intensities, a further change in the Raman stectrum is observed, the peals abruptly shifting to a frequency intermediate -between those of the photoproduct and of pristine C/sub 60/. The shift is accompanied by a dramatic increase in the Raman intensity. Upon reduction of the intensity, the C/sub 60/ spectrum is recovered, indicating that the photochemical process is reversible under high intensity illumination. The nature of the high intensity intermediate is discussed.
  • Keywords
    Degradation; Frequency; Lighting; Photochemistry; Probes; Raman scattering; Spectroscopy; Stationary state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
  • Conference_Location
    Seoul, Korea
  • Type

    conf

  • DOI
    10.1109/STSM.1994.834646
  • Filename
    834646