• DocumentCode
    1879482
  • Title

    Optimize Transition Stages of the Integrated SPC/EPC Process Using Neural Network and Improved Ant Colony Algorithm

  • Author

    Shi, Ying

  • Author_Institution
    Sch. of Manage. Sci. & Eng., Zhengzhou Inst. of Aeronaut. Ind. Manage., Zhengzhou, China
  • fYear
    2010
  • fDate
    10-12 Dec. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Product quality plays an important role in facing competition and gaining competitiveness. Both Engineering Process Controllers (EPC) and Statistical Process Control (SPC) are effective methods of monitoring and adjusting the transition stages to improve process quality. At the same time, neural network was adopted to monitor the process and a flexible model is developed to determine optimal adjustable point for the integrated SPC/EPC. We adopt the improved ant colony algorithm to deal with the above model under the advanced machine choose rule: After all ants crawled, this algorithm could adjust pheromone aiming at whether it got into part convergence, this could help algorithm to get best solution faster. In the end, simulation experiments are done to verify the advantages. Results show that this algorithm can not only reduce the volatility of the process output and enhance system performance; and the integrated control method is more potential cost advantages.
  • Keywords
    control engineering computing; neural nets; optimisation; production engineering computing; quality assurance; quality control; statistical process control; engineering process controllers; flexible model; improved ant colony algorithm; integrated SPC/EPC process; integrated control method; neural network; optimal adjustable point; process quality; product quality; statistical process control; Artificial neural networks; Biological neural networks; Convergence; Monitoring; Process control; Production; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence and Software Engineering (CiSE), 2010 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5391-7
  • Electronic_ISBN
    978-1-4244-5392-4
  • Type

    conf

  • DOI
    10.1109/CISE.2010.5677141
  • Filename
    5677141