Title :
VTest program mixed-signal virtual test approach
Author :
Perkins, Edward G. ; Wong, Joseph J.
Author_Institution :
Integr, Beaverton, OR, USA
Abstract :
The VTest (Virtual Test) Program is producing an open environment and a methodology for Virtual Test development of TPSs for mixed-signal PCBs/LRMs. The VTest effort is paving the way for the integration of Design and Test by providing an EDA-based system solution emphasizing Design for Test and the Re-Use of Design information in Test Development. The VTest solution incorporates the CAE/CAD/CAT software tools necessary for virtual test of digital, analog and mixed-signal technology PCBs/LRMs, as well as the tools and methodologies that support the use of automatic test program generation for multiple target testers. This paper discusses the VTest solution architecture and the VTest approach to mixed-signal TPS development
Keywords :
automatic test equipment; automatic test software; circuit CAD; computer aided engineering; computer architecture; design for testability; military avionics; military computing; mixed analogue-digital integrated circuits; printed circuit testing; software tools; CAE/CAD/CAT software tools; Design for Test; EDA; TPS; US Air Force; VTest program; mixed-signal PCBs/LRM; mixed-signal technology; mixed-signal virtual test; open environment; Automatic testing; Circuit testing; Design engineering; Electronic equipment testing; Electronic mail; Fixtures; Life testing; Signal design; Software testing; System testing;
Conference_Titel :
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-4162-7
DOI :
10.1109/AUTEST.1997.633554
