VTest program mixed-signal virtual test approach

Author

Perkins, Edward G. ; Wong, Joseph J.

Author_Institution

Integr, Beaverton, OR, USA

fYear

1997

fDate

22-25 Sep 1997

Firstpage

60

Lastpage

71

Abstract

The VTest (Virtual Test) Program is producing an open environment and a methodology for Virtual Test development of TPSs for mixed-signal PCBs/LRMs. The VTest effort is paving the way for the integration of Design and Test by providing an EDA-based system solution emphasizing Design for Test and the Re-Use of Design information in Test Development. The VTest solution incorporates the CAE/CAD/CAT software tools necessary for virtual test of digital, analog and mixed-signal technology PCBs/LRMs, as well as the tools and methodologies that support the use of automatic test program generation for multiple target testers. This paper discusses the VTest solution architecture and the VTest approach to mixed-signal TPS development

Keywords

automatic test equipment; automatic test software; circuit CAD; computer aided engineering; computer architecture; design for testability; military avionics; military computing; mixed analogue-digital integrated circuits; printed circuit testing; software tools; CAE/CAD/CAT software tools; Design for Test; EDA; TPS; US Air Force; VTest program; mixed-signal PCBs/LRM; mixed-signal technology; mixed-signal virtual test; open environment; Automatic testing; Circuit testing; Design engineering; Electronic equipment testing; Electronic mail; Fixtures; Life testing; Signal design; Software testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings

Conference_Location

Anaheim, CA

Print_ISBN

0-7803-4162-7

Type

conf

DOI

10.1109/AUTEST.1997.633554

Filename

633554