Title :
High-resolution electro-optic mapping of near-field distributions in integrated microwave circuits
Author :
Yang, K. ; David, G. ; Robertson, S. ; Whitaker, J.F. ; Katehi, L.P.B.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
A field mapping system based on external electrooptic sampling has been developed in order to determine all components of the electric near-field distribution of guided microwaves with high spatial resolution. The capabilities of the setup are demonstrated by 2D-measurements of normal and tangential fields in a microwave distribution network.
Keywords :
electric field measurement; electro-optical effects; integrated circuit measurement; microwave integrated circuits; microwave measurement; 2D measurement; electric near-field distribution; guided microwaves; high-resolution electro-optic mapping; integrated microwave circuit; microwave distribution network; Antenna measurements; Circuit testing; Integrated circuit measurements; Laser beams; Optical beams; Optical sensors; Probes; Sampling methods; Spatial resolution; Ultrafast optics;
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4471-5
DOI :
10.1109/MWSYM.1998.705148
