Title :
Remote Control for Microscopy Applications
Author :
Mighela, F. ; Perra, C.
Author_Institution :
Dept. of Electr. & Electron. Eng., Cagliari Univ.
Abstract :
The first remote instruments have been used during the World War I. Starting from this moment an increasing number of instruments has become remote controlled. Despite the many announcements, real remote control has not been achieved for a vast class of instruments. The paper proposes an application to remote control a scanning electron microscope
Keywords :
scanning electron microscopes; scanning electron microscopy; telecontrol; remote control; scanning electron microscope; Bandwidth; Collaboration; Computer aided manufacturing; Electron microscopy; IEEE news; Instrumentation and measurement; Instruments; Laboratories; Pressure measurement; Scanning electron microscopy; Remote Control; Scanning Electron Microscope (SEM);
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328584
