Title :
Two-Dimensional MEMS Scanner for Dual-Axes Confocal in Vivo Microscopy
Author :
Ra, H. ; Taguchi, Y. ; Lee, D. ; Piyawattanametha, W. ; Solgaard, O.
Author_Institution :
Edward L. Ginzton Laboratory, Department of Electrical Engineering, Stanford University, USA
Abstract :
This paper presents a two-dimensional (2-D) MicroElectroMechanical system (MEMS) scanner that enables dual-axes confocal microscopy. Dual-axes confocal microscopy provides high resolution in both transverse and axial directions, and is also well-suited for miniaturization and integration into endoscopes for in vivo imaging. A gimbaled MEMS scanner is fabricated on a double silicon-on-insulator (SOI) wafer (a silicon wafer bonded on a SOI wafer) and is actuated by self-aligned, vertical, electrostatic combdrives. The imaging capability of the MEMS mirror is successfully demonstrated in a breadboard setup. Reflectance images with a field of view (FOV) of 344 μm × 417 μm are achieved at 8 frames per second. The transverse resolution is 3.94 μm and 6.68 μm for the horizontal and vertical dimensions, respectively.
Keywords :
Endoscopes; High-resolution imaging; Image resolution; In vivo; Microelectromechanical systems; Micromechanical devices; Microscopy; Silicon on insulator technology; Two dimensional displays; Wafer bonding;
Conference_Titel :
Micro Electro Mechanical Systems, 2006. MEMS 2006 Istanbul. 19th IEEE International Conference on
Conference_Location :
Istanbul, Turkey
Print_ISBN :
0-7803-9475-5
DOI :
10.1109/MEMSYS.2006.1627936
