Title :
Modeling and analysis of a novel rectifier voltage stress mechanism
Author :
Yan, Chao ; Wu, Hongyang ; Zeng, Jianhong ; Ying, Jianping
Author_Institution :
Delta Power Electron. Center, Shanghai, China
Abstract :
This paper presents a novel output rectifier voltage stress mechanism at light load for a phase shifted full bridge converter. The resonance between parasitic capacitor, leakage inductor and external inductor during duty cycle loss period contributes a lot to the voltage stress of the output rectifier at light load. Due to the parasitic resonance, the voltage stress of the rectifier at light load case is typically more severe than that at heavy load case. The paper explains the novel rectifier voltage stress mechanism and verifies it by experimental results.
Keywords :
DC-DC power convertors; circuit resonance; phase shifters; power capacitors; power inductors; rectifying circuits; duty cycle losses; leakage inductor; light loads; parasitic capacitor; parasitic resonance; phase shifted full bridge converter; rectifier voltage stress mechanism; Bridge circuits; Inductors; Leg; Power transformers; Rectifiers; Resonance; Stress; Switches; Switching converters; Voltage;
Conference_Titel :
Power Electronics Specialists Conference, 2004. PESC 04. 2004 IEEE 35th Annual
Print_ISBN :
0-7803-8399-0
DOI :
10.1109/PESC.2004.1355151