Title :
Statistical techniques for blind detection & discrimination of m-sequence codes in DS/SS systems
Author :
Adams, Ernest R. ; Gouda, Mamdouh ; Hill, Peter C J
Author_Institution :
Commun. Electron. & Signal Process. Group, Cranfield Inst. of Technol., Bedford, UK
Abstract :
Advances in modern DSP techniques provide a means for intercepting smart covert signal emitters by taking account of the structural properties of their waveform and/or spectra. Previous research has shown that higher-order statistical processing can detect and characterise direct-sequence spread-spectrum signals. Triple correlation analysis is able to detect m-sequence chip codes and also estimate the associated generator polynomials. The process works with full code frames and partial coded windows in noisy data modulated channels. The research reported concentrates on an investigation into various statistical methods for discriminating multiple DS/SS code sequences and also search techniques for blind detection of m-sequences where none of the code parameters is known to the intercept receiver in advance
Keywords :
correlation methods; higher order statistics; m-sequences; modulation; polynomials; radio receivers; signal detection; signal processing; spectral analysis; spread spectrum communication; telecommunication channels; CDMA; DS/SS systems; DSP techniques; blind detection; direct-sequence spread-spectrum signals; discrimination; full code frames; generator polynomials; higher-order statistical processing; intercept receiver; m-sequence codes; noisy data modulated channels; partial coded windows; research; search techniques; smart covert signal emitters; spectra; statistical techniques; structural properties; triple correlation analysis; waveform; Digital signal processing chips; Informatics; Interference; Jamming; Modulation coding; Multiaccess communication; Signal processing; Spread spectrum communication; Statistical analysis; Working environment noise;
Conference_Titel :
Spread Spectrum Techniques and Applications, 1998. Proceedings., 1998 IEEE 5th International Symposium on
Conference_Location :
Sun City
Print_ISBN :
0-7803-4281-X
DOI :
10.1109/ISSSTA.1998.722499