• DocumentCode
    1881003
  • Title

    XPS analysis of thermal and plasma treated polyphenylene vinylene thin films

  • Author

    Nguyenl, T.P. ; Amgaad, K. ; Cailler, M. ; Tran, Vi Hoa

  • Author_Institution
    IMN
  • fYear
    1994
  • fDate
    24-29 July 1994
  • Firstpage
    48
  • Lastpage
    48
  • Abstract
    Summary form only given. It is well known that the thermal or plasma treatments of the polymer films before depositing a metallic layer can appreciably enhance the adhesion property in these films. In this work, we investigated the interface formed on the polyphenylene-vinylene (PPV) thin film by depositng a thin layer of aluminium using XPS technique. Comparison of these results to those obtained in untreated sample shows that: i) thermal treatment does not modify the nature of the interface but probably affects the aluminium layer (grain size) which in turn increases the mechanical property of the interface, ii) plasma treatment (with argon, oxygen and nitrogen) has differimt effects depending on the nature of the plasma gas used. Contrary to argon which has no influence on the interface, oxygen and nitrogen treatments induce both mechanical and chemical modification of the PPV surface favoring the penetration and reaction of aluminium with the polymer.
  • Keywords
    Aluminum; Argon; Isotopes; Nitrogen; Paramagnetic resonance; Plasma chemistry; Plasma properties; Polymer films; Transistors; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
  • Conference_Location
    Seoul, Korea
  • Type

    conf

  • DOI
    10.1109/STSM.1994.834711
  • Filename
    834711