Title :
Reliability of infrared surface light emitting diodes suitable for military and avionic wavelength division multiplexing systems
Author :
Lindsay, C.E. ; Conlon, R.F.B.
Author_Institution :
Plessey Res. & Technol., Towcester, UK
Abstract :
A comparative study of the reliability of high-power double-heterojunction surface light-emitting diodes (SLEDs) operating at 750 nm, 1060 nm, and 1300 nm is reported. A data analysis from 9000 h of fully automated life testing is included. Degradation and failure characteristics specific to each operating wavelength are described and related to structural and performance data on each device batch. Median life and activation energies are calculated. The devices examined have shown impressive reliability at very high current densities and temperature (23 kA/cm2 and 135°C). The 1300-nm devices, which in common with all three wavelengths received no pretest burn in, registered 0/60 failures after 9000 h of testing. Based on the calculated activation energies, the best batches at each wavelength produce MTTF (mean time to failure) figures in excess of 106 h at 25°C ambient and full DC drive
Keywords :
aircraft communication; frequency division multiplexing; life testing; light emitting diodes; military equipment; reliability; semiconductor device testing; 1060 nm; 1300 nm; 135 degC; 25 degC; 750 nm; 9000 h; activation energies; automated life testing; avionic wavelength division multiplexing systems; degradation; failure characteristics; high-power double-heterojunction; infrared surface light emitting diodes; mean time to failure; median life; military systems; performance data; reliability; Aerospace electronics; Heterojunctions; Life testing; Light emitting diodes; Power generation; Power system reliability; Superluminescent diodes; Surface waves; Temperature sensors; Wavelength division multiplexing;
Conference_Titel :
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location :
Las Vegas, NV
DOI :
10.1109/ECTC.1990.122166
