• DocumentCode
    1881188
  • Title

    Scenario-based design for a cloud forensics portal

  • Author

    Jackson, Curtis ; Agrawal, Rajeev ; Walker, Jessie ; Grosky, William

  • Author_Institution
    Dept. of Comput. Syst. Technol., North Carolina A & T State Univ., Greensboro, NC, USA
  • fYear
    2015
  • fDate
    14-16 April 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Cloud computing continues to transform how we address security challenges in closed and private networks. Given the advanced functionality offered by cloud computing, network monitoring and digital forensics efforts are potentially detectable and service interruptive which affects the effectiveness and thoroughness of digital forensic methods. Virtualization, the cost-effective delivery platform for clouds and data centers, provides an opportunity for Virtual Machine Introspection (VMI) through the hypervisor. VMI would be an environment to monitor the activity of a Virtual Machine (VM). In this paper, we propose a multi-phase scenario-based design concept within an open source virtualized environment to collect data to validate the hypervisor´s ability to provide a portal for threat monitoring that is effective, undetectable, and non-interruptive.
  • Keywords
    cloud computing; computer centres; digital forensics; public domain software; virtual machines; virtualisation; VMI; closed networks; cloud computing; cloud forensics portal; cost-effective delivery platform; data centers; digital forensics efforts; hypervisor; multiphase scenario-based design concept; network monitoring; open source virtualized environment; private networks; scenario-based design; security challenges; threat monitoring; virtual machine introspection; virtualization; Computers; Forensics; Malware; Monitoring; Virtual machine monitors; Virtual machining; Virtualization; Cloud; Forensics; Scenario-based; Virtual Machine Monitor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Technologies for Homeland Security (HST), 2015 IEEE International Symposium on
  • Conference_Location
    Waltham, MA
  • Print_ISBN
    978-1-4799-1736-5
  • Type

    conf

  • DOI
    10.1109/THS.2015.7225260
  • Filename
    7225260