DocumentCode
1881230
Title
Attacks on correlated peer-to-peer networks: An analytical study
Author
Srivastava, Animesh ; Mitra, Bivas ; Peruani, Fernando ; Ganguly, Niloy
Author_Institution
Dept. of CSE, IIT Kharagpur, Kharagpur, India
fYear
2011
fDate
10-15 April 2011
Firstpage
1076
Lastpage
1081
Abstract
Analysis of attacks on real-world p2p networks and their impact on the topology of the network is difficult as the interconnections among the peers are not random; rather they evolve based on the needs of the connected peers and this brings in degree-degree correlation in the network. We develop an analytical framework to analyze the change in topology of a correlated network and propose a generalized model based on percolation theory to measure the resilience of a correlated network against any arbitrary attack. We present the results and analysis mainly on correlated superpeer networks and correlated bimodal networks. Some of the intricate questions on the stability of real-world superpeer network that we answer analytically are: (a) dependence of percolation threshold of a superpeer network on its peer degree, superpeer degree at different levels of degree-degree correlation (b) minimum peer degree required to make a superpeer topology more resilient. All our theoretical results are validated through simulations and the results are in very good agreement.
Keywords
computer network security; correlation methods; peer-to-peer computing; telecommunication network topology; arbitrary attack analysis; correlated bimodal network; correlated peer-to-peer network; correlated superpeer network; generalized model; intricate question; minimum peer degree; percolation theory; percolation threshold; real-world P2P network topology; real-world superpeer network stability; superpeer degree; superpeer network; superpeer topology; Correlation; Network topology; Peer to peer computing; Simulation; Stability criteria; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Communications Workshops (INFOCOM WKSHPS), 2011 IEEE Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4577-0249-5
Electronic_ISBN
978-1-4577-0248-8
Type
conf
DOI
10.1109/INFCOMW.2011.5928787
Filename
5928787
Link To Document